An Enhanced Common Path Interference Measurement Method for Optical Refractive Indices

Cheng Chi Wang; Ming Jyi Jang; Yuan Hung Peng

doi:10.4028/www.scientific.net/KEM.364-366.86

Paper Titles

Toward the Accurate Coverage of Aspheric Surfaces Using Two-Dimensional Scanning Paths for Minimizing Regular Errors
p.64

Ultraprecision Ductile-Regime Cutting of Optical Glass
p.69

A Non-Contact Displacement Sensor with Diffraction Grating Metrology System for Profile Measurement
p.74

Absolute Measurement of Aspheric Surfaces Using White-Light Interferometry
p.80

An Enhanced Common Path Interference Measurement Method for Optical Refractive Indices
p.86

An Optical System for the Ball Grid Array Inspection and Measurement Using the Back-Propagation Neural Network Technology
p.92

Analytical Calculation of the Light Extraction Efficiency of Micro Cavities Light-Emitting Diodes
p.98

Automatic Optical Inspection and Laser Cleaning of Image Sensors
p.104

Evaluating Frequency Error Property of Wavefront of Large Optics by PSD Collapse
p.108

HomeKey Engineering MaterialsKey Engineering Materials Vols. 364-366An Enhanced Common Path Interference Measurement...

An Enhanced Common Path Interference Measurement Method for Optical Refractive Indices

Abstract:

This study presents an enhanced common path interference system designed to measure the refractive index of crystal optical components. The proposed system is based on the classic Michelson interferometer and comprises a frequency stabilized helium-neon (He-Ne) laser, a beam splitter, a fixed mirror, an adjustable mirror, and a light detection system. The waveplate of interest was clamped to a rotatory motor and positioned between the beam splitter and the fixed mirror. The refractive index of the waveplate was then derived from the change in rotational angle of the waveplate as it moved from one position of minimum interference to the next. The measurement system proposed in this study is simple in construction, straightforward in operation, and robust to the effects of experimental noise. Furthermore, the system is a non-contact measurement system, and hence does not damage the optical component of interest. The experimental results are found to be in good agreement with the theoretical results. Therefore, the proposed system provides a viable means for the rapid experimental evaluation of the optical characteristics of quartz components.

You might also be interested in these eBooks

Optics Design and Precision Manufacturing Technologies

View Preview

Info:

Periodical:

Key Engineering Materials (Volumes 364-366)

Pages:

86-91

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.364-366.86

Citation:

Cite this paper

Online since:

December 2007

Authors:

Cheng Chi Wang, Ming Jyi Jang, Yuan Hung Peng

Keywords:

Birefringent Crystal, Michelson Interferometer, Optical-Path Difference, Refractive Index

Export:

RIS, BibTeX

Price:

Permissions:

Request Permissions

References

[1] Y.C. Huang, in: Optics Communications, Direct measurement of refractive indices ( en , on ) of a linear birefringent retardation plate, Vol. 133 (2001), p.11.

DOI: 10.1016/s0030-4018(96)00410-5

Google Scholar

[2] H.K. Teng, C. Chou and H. Fong, in: Optics Communications, Polarization- shifting interferometry on two-dimensional linear birefringent parameters measurement, Vol. 224 (2003), p.197.

DOI: 10.1016/s0030-4018(03)01762-0

Google Scholar

[3] Y.C. Huang, C. Chou, and M. Chang, in: Optics Communications, Direct measurement of refractive indices ( en , on )of a linear birefringent retardation plate, Vol. 133 (1997), p.11.

DOI: 10.1016/s0030-4018(96)00410-5

Google Scholar

[4] B.E. Benkelfat, E.H. Horache, Q. Zou, and B. Vinouze, in: Optics Communications, An electro modulation technique for direct and accurate measurement of birefringence, Vol. 221 (2003), p.271.

DOI: 10.1016/s0030-4018(03)01539-6

Google Scholar

[5] Optics Guide, CASIX co., [no=1. 5427, ne=1. 5518(633nm)] (1995).

Google Scholar