Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties

Juan Rodríquez-Carvajal; Thierry Roisnel

doi:10.4028/www.scientific.net/MSF.443-444.123

Paper Titles

Approximate Estimation of Contributions to Pure X-Ray Diffraction Line Profiles from Crystallite Shapes, Sizes and Strains by Analysing Peak Widths
p.107

Study of Submicrocrystalline Materials by Conventional Powder Diffraction and Diffuse Scattering in Transmitted Wave
p.111

Thickness Determination of Thin Polycrystalline Films by Grazing Incidence X-Ray Diffraction
p.115

XRD Line Broadening Analysis with Ball Milled Palladium
p.119

Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties
p.123

Line Profile Analysis (LPA) Methods: Systematic Ranking of the Quality of their Basic Assumptions
p.127

Applicability of the Crystallite Group Method to Fibre Textured Specimens
p.131

Optimization of X-Ray Pole Figure Measurement
p.137

Single Reflection Method for Pole-Density Measurements Accounting for Secondary Extinction in Textured Films
p.141

HomeMaterials Science ForumMaterials Science Forum Vols. 443-444Line Broadening Analysis Using FullProf*:...

Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties

Abstract:

A short account of the methodology used within FullProf to extract average micro-structural properties from the analysis of broadened lines of constant wavelength diffraction patterns is presented. The approach is based on the Voigt approximation and can be combined with the Rietveld method as well as with the profile matching (Le Bail fit) procedure. Both the instrumental and sample profiles are supposed to be well described by Voigt functions. To get reliable sample parameters a good knowledge of the Instrumental Resolution Function (IRF) is needed. Only a phenomenological treatment, in terms of coherent size domains and strains due to structural defects, is performed.

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Periodical:

Materials Science Forum (Volumes 443-444)

Pages:

123-126

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.443-444.123

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Online since:

January 2004

Authors:

Juan Rodríquez-Carvajal, Thierry Roisnel

Keywords:

Instrumental Resolution Function, Line Broadening, Micro-Structural Properties, Voigt Function

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