Switching Losses in a SiC-Based DC-DC Multilevel Boost Converter
p.1241
p.1241
High Voltage SiC Schottky Diodes in Rectifiers for X-Ray Generators
p.1245
p.1245
SiC Solid-State Disconnect for High Power System Applications
p.1249
p.1249
A 450°C High Voltage Gain AC Coupled Differential Amplifier
p.1253
p.1253
Bipolar Integrated OR-NOR Gate in 4H-SiC
p.1257
p.1257
300C Capable Digital Integrated Circuits in SiC Technology
p.1261
p.1261
Reliability of Silicon Carbide Integrated Circuits at 300°C
p.1265
p.1265
Direct Frequency Modulation of a High Temperature Silicon Carbide Oscillator
p.1269
p.1269
Conversion of Si Nanowires into SiC Nanotubes
p.1275
p.1275
Bipolar Integrated OR-NOR Gate in 4H-SiC
Abstract:
An integrated bipolar OR-NOR gate based on emitter coupled logic (ECL) is demonstrated in 4H-SiC. Operated from 27 up to 300 °C on –15 V supply voltage the logic gate exhibits stable noise margins (NMs) of about 1 V in the entire temperature range.
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Info:
Periodical:
Materials Science Forum (Volumes 717-720)
Pages:
1257-1260
Citation:
Online since:
May 2012
Price:
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