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HomeMaterials Science ForumMaterials Science Forum Vols. 778-780Temperature Dependence of Impact Ionization...

Temperature Dependence of Impact Ionization Coefficients in 4H-SiC

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Abstract:

Impact ionization coefficients of 4H-SiC were measured at room temperature and at elevated temperatures up to 200°C. Photomultiplication measurement was done in two complementary photodiodes to measure the multiplication factors of holes (M_p) and electrons (M_n), and ionization coefficients were extracted. Calculated breakdown voltage using the obtained ionization coefficients showed good agreement with the measured values in this study, and also in other reported PiN diodes and MOSFETs. In high-temperature measurement, breakdown voltage exhibited a positive temperature coefficient and multiplication factors showed a negative temperature coefficient. Therefore, extracted ionization coefficient has decreased which can be explained by the increase of phonon scattering. The calculated temperature dependence of breakdown voltage agreed well with the measured values not only for the diodes in this study, but also in PiN diode in other literature.

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Periodical:

Materials Science Forum (Volumes 778-780)

Pages:

461-466

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.778-780.461

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Online since:

February 2014

Authors:

Hiroki Niwa*, Jun Suda, Tsunenobu Kimoto

Keywords:

Avalanche Breakdown, Breakdown Voltage, Device Simulation, High-Temperature, Impact Ionization Coefficient, Photodiode

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