DOI QR코드

DOI QR Code

Fabrication of Single Crystal Silicon Micro-Tensile Test Specimens and Thin Film Aluminum Markers for Measuring Tensile Strain Using MEMS Processes

MEMS 공정을 이용한 단결정 실리콘 미세 인장시편과 미세 변형 측정용 알루미늄 Marker의 제조

  • 박준식 (전자부품연구원 나노메카트로닉스 연구센터) ;
  • 전창성 (전자부품연구원 나노메카트로닉스 연구센) ;
  • 박광범 (전자부품연구원 나노메카트로닉스 연구센) ;
  • 윤대원 (전자부품연구원 나노메카트로닉스 연구센) ;
  • 이형욱 (한국생산기술연구원 생산공정기술본) ;
  • 이낙규 (한국생산기술연구원 생산공정기술본) ;
  • 이상목 (한국생산기술연구원 생산공정기술본) ;
  • 나경환 (한국생산기술연구원 생산공정기술본) ;
  • 최현석 (한양대학교 기계공학과)
  • Published : 2004.06.01

Abstract

Micro tensile test specimens of thin film single crystal silicon for the most useful structural materials in MEMS (Micro Electro Mechanical System) devices were fabricated using SOI (Silicon-on-Insulator) wafers and MEMS processes. Dimensions of micro tensile test specimens were thickness of $7\mu\textrm{m}$, width of 50~$350\mu\textrm{m}$, and length of 2mm. Top and bottom silicon were etched using by deep RIE (Reactive Ion Etching). Thin film aluminum markers on testing region of specimens with width of $5\mu\textrm{m}$, lengths of 30~$180\mu\textrm{m}$ and thickness of 200 nm for measuring tensile strain were fabricated by aluminum wet etching method. Fabricated side wall angles of aluminum marker were about $45^{\circ}~50^{\circ}$. He-Ne laser with wavelength of 633nm was used for checking fringed patterns.

Keywords

References

  1. IEEE proceedings of MEMS '96 Micro tensile-test system fabricated on a single crystal silicon chip K.Sato;M.Shikida;M.Yamasaki;T.Yoshioka
  2. Proc. IEEE 10th annual international workshop on micro electro mechanical systems Measurements of mechanical properties of microfabricated thin films H.Ogawa;K.Suzuki;S.Kaneko;Y.Nakano;Y.Ishikawa;T.Kitahara
  3. J. Microelectromechanical Systems v.7 no.1 Specimen size effect on tensile strength of surface -micromachined polycrystalline silicon thin films T.Tsuchiya;O.Tabata;J.Sakata;Y.Taga https://doi.org/10.1109/84.661392
  4. Proc. of the 15th IEEE International Conference on MEMS 2002 Mechanical characterization of sub-micrometer DLC films by AFM tensile testing for surface modification in MEMS Y.Isono;T.Namazu;N.Terayama;T.Tanaka
  5. J. Microelectromechanical Systems v.6 no.3 A new technique for measuring the mechanical properties of thin films W.Sharpe Jr.;B.Yuan;R.Edwards https://doi.org/10.1109/84.623107
  6. Opt. Eng. v.21 no.3 Applications of the interferometric strain /displacement gage W.Sharpe Jr.